Journals

Evaluation of sparsity metrics and evolutionary algorithms applied for normalization of H&E histological images

Journal Name    Pattern Analysis and Applications
Year of Publication    2024
Authors Name    Tosta T.A.A., de Faria P.R., Neves L.A., Martins A.S., Kaushal C., do Nascimento M.Z.
School/College    Chitkara University Institute of Engineering and Technology