Journals

CaiT-YOLOv9s-CBAM Deep Learning Model for Wheat Fungal Diseases: In-Depth Multifaceted Approach for Feature Refinement, Localization and Recognition

Journal Name    SN Computer Science
Year of Publication    2026
Authors Name    Kumar D.; Kukreja V.; Al-Sarem M.; Bhardwaj V.
School/College    Chitkara University Institute of Engineering and Technology, Chitkara University, Punjab, Rajpura