Dr. Muthukumaran M
Associate Professor

muthukumaran.m@chitkara.edu.in

Expert Areas : Computer vision, weld X-radiography image analysis, Pattern recognition

Dr Muthukumaran M received a Ph.D. degree in computer science and engineering with 15 years of experience in the information technology industry, teaching and research. He received a senior research fellowship from Board of Research in Nuclear Sciences, Govt. of India in 2014.

His area of research interest include digital image processing, image enhancement, image segmentation, statistical analysis, feature extraction, pattern recognition and machine learning in digital images. He is a member of the association for computing machinery (ACM) and Indian Society for Non-Destructive Testing (ISNT). He is also interested in developing scientific software applications.

  • Research
  • Teaching
  • Awards
  • Patents
  • Education
  • Service
JOURNAL ARTICLES:
  1. Jagalingam Pushparaj and Muthukumaran Malarvel, Panchromatic image denoising by a log-normal-distribution-based anisotropic diffusion model, Journal of Applied Remote Sensing, SPIE, 13(1), 0414515 (2019).  (SCI-E Indexed – IF 1.344)
  2. Muthukumaran Malarvel, Gopalakrishnan Sethumadhavan, Purna Chandra Rao Bhagi, Soumitra Kar, Thangavel Saravanan, Arunmuthu Krishnan,  Anisotropic diffusion based denoising on X-radiography images to detect weld defects, Digital Signal Processing 68 (2017) 112–126. (SCI Indexed- IF 2.792)
  3. Muthukumaran Malarvel, Gopalakrishnan Sethumadhavan, Purna Chandra Rao Bhagi, Soumitra Kar, Thangavel Saravanan, An improved version of Otsu’s method for segmentation of weld defects on X-radiography images, Optik 142 (2017) 109–118. (SCI Indexed – IF 1.914)
  4. Srinivasan Sankaran, Muthukumaran Malarvel, Gopalakrishnan Sethumadhavana, Dinkar Sahal, Quantitation of Malarial parasitemia in Giemsa stained thin blood smears using Six Sigma threshold as preprocessor,  Optik 145 (2017) 225–239. ( SCI Indexed IF: 1.914)
  5. M. Muthukumaran, A. Sivapathi, L. Prabaharan and S. Gopalakrishnan, Discovery of noise existence and noise level estimation in weld x-radiography images using anisotropic diffusion model, Far East Journal of Electronics and Communications, 17(2017) 351-359. (SCOPUS Indexed)
  6. M. Muthukumaran, L. Prabaharan, A. Sivapathi and S. Gopalakrishnan, A comparative analysis of an anisotropic diffusion image denoising methods on weld x-radiography images, Far East Journal of Electronics and Communications, 17(2017) 267-281. (SCOPUS Indexed)
  7. M. Muthukumaran, A. Sivapathi, L. Prabaharan and S. Gopalakrishnan, Performance analysis of thresholding techniques on weld x-radiography images, ARPN Journal of Engineering and Applied Sciences, 11(2016) 12836- 12842. (SCOPUS Indexed)
CONFERENCE PUBLICATIONS:
  1. Muthukumaran Malarvel and Soumya Ranjan Nayak, Region grow using fuzzy automated seed selection for weld defect segmentation in X-radiography image, The International Conference on Artificial Intelligence in Manufacturing & Renewable Energy (ICAIMRE – 2019). (SCOPUS Indexed)
  2. Muthukumaran Malarvel, Gopalakrishnan Sethumadhavan, Purna Chandra Rao Bhagi, Thangavel Saravanan, Arunmuthu Krishnan, Region growing based segmentation with automatic seed selection using threshold techniques on X-radiography images, 2016 IEEE International Conference on Computational Intelligence and Computing Research. (SCOPUS Indexed)

 

CHAPTER PUBLICATIONS:

  1. Muthukumaran Malarvel, S Sivakumar, A Performance Study of Image Quality Attributes on Smoothened Image Obtained by Anisotropic Diffusion-Based Models: A Comparative Study and Performance Evaluation, IGI-Global, 2019. (SCOPUS Indexed).
  2. Sankaran S., Hagerty J.R., Muthukumaran Malarvel, Sethumadhavan G., Stoecker W.V. (2019) A Comparative Assessment of Segmentations on Skin Lesion Through Various Entropy and Six Sigma Thresholds. In: Proceedings of the International Conference on ISMAC in Computational Vision and Bio-Engineering 2018 (ISMAC-CVB). ISMAC 2018. vol 30. Springer, Cham (SCOPUS Indexed).

 

BOOK PUBLICATIONS:

  1. Muthukumaran Malarvel, Soumya Ranjan Nayak , Surya Narayan Panda,  Prasant Kumar Pattnaik , N. Muangnak, Machine vision inspection systems: Image Processing, Concepts, Methodologies and Applications, Wiley Publications.

Field of specialization: Digital image processing, Machine learning, data mining, data structures, database management systems.

  • Organized one-day national level seminar on “Recent trends in unmanned aircraft systems and its applications” on 2nd November 2018 at K L Deemed University, Vijayawada. Resource persons from IISc and Avian Aerospace Pvt. Ltd, Bengaluru.

Membership:

  • Member in Indian Society for non-destructive testing (ISNT), Chennai, India.
  • Professional Member in Association for Computing Machinery (ACM)
  • Member in International Association of Engineers (IAENG) No. 220962.
  • Member in the computer science teachers association (CSTA) in partnership with ACM.
  • Member of IEEE
  • Senior Research Fellowship, Board of Research in Nuclear Sciences (BRNS) grant no.2013/36/40-
  • Bagged best paper award in IEEE international conference in 2016.
  • Best thesis awardissued by Prof V. Kamakoti, Professor, Dept. of CSE, IIT Madras.

PATENT FILED:

  1. Device for segregating objects in limited illumination | Patent No. : IP 201911041599, dt. October-2019.
  2. Device For Surface Roughness Measurement of An Object | Patent No. : IP 201911043717, dt. October-2019.

Ph.D (Computer Science and Engineering)

M.Tech. (Computer Science and Engineering)

M.C.A. (Computer Applications)

6 years in information technology industry as a developer.

4 years in research as a senior research fellow.

5 years in teaching experience at engineering colleges.